SiC(碳化硅)MOSFET
SiC MOSFET道理上在开关进程中不会发生拖尾尾电流,可高速运转且开关耗损低。低导通电阻和小型芯片尺寸培养较低的电容和栅极电荷。别的,SiC还具备如导通电阻增添量很小的优良的资料属性,并且有比导通电阻能够或许跟着温度的下降而回升2倍以上的硅(Si)器件更优良的封装微型化和节能的长处。
第4代SiC MOSFET
新推出的第4代SiC MOSFET,在改良短路耐受时候的条件下完成了业内超低导通电阻。别的,还具备低开关耗损和撑持15V栅-源电压等特色,有助于装备进一步节能。
SiC MOSFET、SiC SBD的分立封装成长计划
今朝的封装声势及开辟中的封装。

轻松搜刮
参数搜刮
产物提要
第4代SiC MOSFET
罗姆于2020年完成开辟的第4代SiC MOSFET,是在改良短路耐受时候的情况下完成业内超低导通电阻的产物,今朝不只可供给裸芯片,还可供给分立封装的产物。该产物有助于完成车载逆变器和各类开关电源等各类利用的小型化和低功耗。
特色
1.在改良短路耐受时候的条件下完成业内超低导通电阻
在第4代SiC MOSFET中,经由进程进一步改良罗姆自有的双沟槽布局,胜利地在改良短路耐受时候的条件下,使导通电阻比以往产物下降约40%。作为SiC MOSFET,完成了业界超低的导通电阻。
2.经由进程大幅下降寄生电容,完成更低开关耗损
第4代SiC MOSFET,经由进程大幅下降栅泄电容(Cgd),胜利地使开关耗损比以往产物下降约50%。
3.撑持15V栅源驱动电压,使利用产物的设想更轻易
在MOSFET中,须要在器件ON时向晶体管的栅极施加必然量的电压。除到第3代SiC MOSFET为止所撑持的18V栅源驱动电压(Vgs)外,第4代SiC MOSFET还撑持更轻易处置的15V栅源驱动电压,可与IGBT一路用来设想驱动电路(栅极驱动电路)。


利用示例:主驱逆变器
有助于包罗车载逆变器和各类开关电源在内的各类利用产物完成明显的小型化和更低功耗,比方在用于车载主驱逆变器时,与利用IGBT时比拟,效力能够或许获得光鲜明显晋升,首要表现在逆变器的高扭矩和低转速规模,从而能够或许使电耗削减6%(按国际规范“WLTC燃料耗损量测试”计较)。

第4代SiC MOSFET 撑持信息
评价板

4th Generation SiC MOSFET Half Bridge Evaluation Board
P04SCT4018KE-EVK-001/P05SCT4018KR-EVK-001
P04SCT4018KE-EVK-001/P05SCT4018KR-EVK-001是一款能够或许评价接纳TO-247N/TO-247-4L封装的第4代SiC MOSFET的评价板。对所搭载的SiC MOSFET,能够或许挑选并采办所需导通电阻值的器件来停止评价。该评价板中配有栅极驱动器和核心电路,能够或许削减设想和评价工时。

Evaluation Board HB2637L-EVK-301
The evaluation board is configured in a half bridge set up and thus allows evaluations in different operations modes such as buck, boost, synchronous buck/boost and inverter operations. The board is equipped with two SiC MOSFETs(SCT4036KW7), isolated gate driver BM61S41RFV-C, isolated power supply required for the gate driver, LDO for 5V supply and easy to interface connectors for PWM signals.

EVK Simulatrion (ROHM Solution Simulator)
・P05CT4018KR-EVK-001 Double Pulse Test
・P04SCT4018KE-EVK-001 Double Pulse Test
・HB2637L-EVK-301 Double Pulse Test
咱们对评价板停止了建模,并在在线摹拟器中为第4代SiC MOSFET筹办了双脉冲测试情况。 能够或许经由进程摹拟评价基于任务电压、栅极驱动电路、缓冲电路常数等的开关波形,并有助于削减实机评价的工时和用于对寄生电感器的结果评价等。(须要注册MyROHM)
Documents
White Paper
Application Note
Design Model
| Part Number | Drain-source Voltage[V] | Drain-source On-state Resistance (Typ.(mΩ) |
Package | SPICE Model? |
PLECS Model? |
PSIM Model? |
PCB Library? |
| SCT4045DE | 750 | 45 | TO-247N |
||||
| SCT4026DE | 26 | ||||||
| SCT4013DE | 13 | ||||||
| SCT4062KE | 1200 | 62 | |||||
| SCT4036KE | 36 | ||||||
| SCT4018KE | 18 | ||||||
| SCT4045DR | 750 | 45 | TO-247-4L |
||||
| SCT4026DR | 26 | ||||||
| SCT4013DR | 13 | ||||||
| SCT4062KR | 1200 | 62 | |||||
| SCT4036KR | 36 | ||||||
| SCT4018KR | 18 | ||||||
| SCT4045DW7 | 750 | 45 | TO-263-7L |
||||
| SCT4026DW7 | 26 | ||||||
| SCT4013DW7 | 13 | ||||||
| SCT4062KW7 | 1200 | 62 | |||||
| SCT4036KW7 | 36 | ||||||
| SCT4018KW7 | 18 |
仿真(需登录MyROHM)
- [4th Gen SiC] D-001. P05SCT4018KR-EVK-001 Double Pulse Test
- [4th Gen SiC] D-002. P04SCT4018KE-EVK-001 Double Pulse Test
- [4th Gen SiC] D-003. HB2637L-EVK-301_SCT4036KW7 Double Pulse Test
TO-247N (3pin)
- [4th Gen SiC] A-011b. Totem-pole PFC Vin=220V Vout=400V Pout=3.3kW
- [4th Gen SiC] C-016b. LLC Full-Bridge Vin=400V Vout=500V Pout=3.3kW
TO-247-4L (4pin)
SiC MOSFET 撑持信息
评价板
| Category | SiC Product | Image | Part No. | User Guide | Purchase Board | |
| SiC-MOS | Evaluation Board |
SCT4XXX series Trench(4th Generation) TO-247-N | ![]() |
NEW P04SCT4018KE-EVK-001 |
从网售平台采办 | |
| SCT4XXX series Trench(4th Generation) TO-247-4L | ![]() |
NEW P05SCT4018KR-EVK-001 |
从网售平台采办 | |||
| SCT3XXX series Trench(3rd Generation) TO-247-4L | ![]() |
P02SCT3040KR-EVK-001 | 从网售平台采办 | |||
文档
White Paper
Application Note
手艺记事
Schematic Design & Verification
Thermal Design
Models & Tools
仿真(需登录MyROHM)
ROHM Solution Simulator是在ROHM官网上运转的电子电路仿真东西。从部件选型和元器件单体考证等开辟早期阶段到体系级的考证阶段,各类仿真任务都能够或许在Web上履行。ROHM供给的SiC元器件等功率元器件产物、驱动IC和电源IC等IC产物,都能够或许在靠近现实情况的处置打算电路中疾速简略的一并停止考证,从而可明显延长利用开辟周期。
TO-247N (3pin)
- [4th Gen SiC] A-011b. Totem-pole PFC Vin=220V Vout=400V Pout=3.3kW
- [4th Gen SiC] C-016b. LLC Full-Bridge Vin=400V Vout=500V Pout=3.3kW
TO-247-4L (4pin)
- [4th Gen SiC] A-011a. Totem-pole PFC Vin=220V Vout=400V Pout=3.3kW
- [4th Gen SiC] C-016a. LLC Full-Bridge Vin=400V Vout=500V Pout=3.3kW
- [4th Gen SiC] D-001. P05SCT4018KR-EVK-001 Double Pulse Test
- [4th Gen SiC] D-002. P04SCT4018KE-EVK-001 Double Pulse Test
- [4th Gen SiC] D-003. HB2637L-EVK-301_SCT4036KW7 Double Pulse Test
- A-001. Boost PFC VIN=200V, IIN=2.5A BCM
- A-002. Boost PFC VIN=200V, IIN=2.5A CCM
- A-003. Boost PFC VIN=200V, IIN=2.5A CCM Synchronous FETs
- A-004. Boost PFC VIN=200V, IIN=2.5A DCM
- A-005. Boost PFC VIN=200V, IIN=2.5A DCM Synchronous FETs
- A-006. Interleaved PFC VIN=200V, IIN=2.5A CCM
- A-008. Interleaved PFC VIN=200V, IIN=2.5A DCM
- A-012. Diode-Bridgeless PFC VIN=200V, IIN=2.5A BCM
- B-011. 3-Phase 3-level NPC-T Inverter POUT=10kW
- B-012. 3-Phase 3-level NPC-I Inverter POUT=10kW
- C006. DC-DC Converter, Buck Converter Vo=250V Io=20A
- C007. DC-DC Converter, Buck Converter 2-Phase Vo=250V Io=40A
- C010. DC-DC Converter, Flyback Converter VIN=800V Vo=25V Io=10A
- C011. DC-DC Converter, Forward Converter VIN=500V Vo=25V Io=10A
- C012. DC-DC Converter, LLC Buck Converter Vo=12V Io=250A
- C013. DC-DC Converter, Phase-Shift Buck Converter Vo=12V Io=250A
- C014. DC-DC Converter, Quasi-Resonant Converter VIN=800V Vo=25 Io=10A


